STM measurement of current - potential curves at a semiconductor surface

Publikation: Beitrag in Fachzeitschrift › Konferenzartikel › Begutachtung

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@article{fd738132fc5e40778c83b1908fe9f2f7,

title = "STM measurement of current - potential curves at a semiconductor surface",

author = "Renate Hiesgen and M. Krause and Dieter Meissner",

year = "2000",

month = jun,

day = "23",

doi = "10.1016/s0013-4686(00)00425-4",

language = "English",

volume = "45",

pages = "3213--3223",

journal = "Electrochimica Acta",

issn = "0013-4686",

publisher = "ScienceDirect",

number = "20",

}

TY - JOUR

T1 - STM measurement of current - potential curves at a semiconductor surface

AU - Hiesgen, Renate

AU - Krause, M.

AU - Meissner, Dieter

PY - 2000/6/23

Y1 - 2000/6/23

UR - https://www.scopus.com/pages/publications/0034206540

U2 - 10.1016/s0013-4686(00)00425-4

DO - 10.1016/s0013-4686(00)00425-4

M3 - Conference article

SN - 0013-4686

VL - 45

SP - 3213

EP - 3223

JO - Electrochimica Acta

JF - Electrochimica Acta

IS - 20

ER -