Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping

Ewald Koppensteiner; P. Hamberger; Günther Bauer; H. Kibbel; H. Presting; E. Kasper; A. Pesek

doi:10.1117/12.162744

Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping

Ewald Koppensteiner
, P. Hamberger
, Günther Bauer
, H. Kibbel
, H. Presting
, E. Kasper
, A. Pesek

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Originalsprache	Englisch
Titel	Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II
Seiten	11-20
Seitenumfang	10
Band	1985
DOIs	https://doi.org/10.1117/12.162744
Publikationsstatus	Veröffentlicht - 1993

Publikationsreihe

Name	Proceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)	0277-786X

Wissenschaftszweige

103 Physik, Astronomie
103009 Festkörperphysik
103011 Halbleiterphysik
103017 Magnetismus
103018 Materialphysik
103040 Photonik
202032 Photovoltaik
210006 Nanotechnologie

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10.1117/12.162744

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Koppensteiner, E., Hamberger, P., Bauer, G., Kibbel, H., Presting, H., Kasper, E., & Pesek, A. (1993). Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. in Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II (Band 1985, S. 11-20). (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.162744

Koppensteiner, Ewald ; Hamberger, P. ; Bauer, Günther et al. / Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II. Band 1985 1993. S. 11-20 (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping",

author = "Ewald Koppensteiner and P. Hamberger and G{\"u}nther Bauer and H. Kibbel and H. Presting and E. Kasper and A. Pesek",

year = "1993",

doi = "10.1117/12.162744",

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Koppensteiner, E, Hamberger, P, Bauer, G, Kibbel, H, Presting, H, Kasper, E & Pesek, A 1993, Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. in Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II. Bd. 1985, Proceedings of SPIE - The International Society for Optical Engineering, S. 11-20. https://doi.org/10.1117/12.162744

Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. / Koppensteiner, Ewald; Hamberger, P.; Bauer, Günther et al.
Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II. Band 1985 1993. S. 11-20 (Proceedings of SPIE - The International Society for Optical Engineering).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

TY - GEN

T1 - Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping

AU - Koppensteiner, Ewald

AU - Hamberger, P.

AU - Bauer, Günther

AU - Kibbel, H.

AU - Presting, H.

AU - Kasper, E.

AU - Pesek, A.

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/85075881203

U2 - 10.1117/12.162744

DO - 10.1117/12.162744

M3 - Conference proceedings

SN - 1-55899-352-5

VL - 1985

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 11

EP - 20

BT - Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II

ER -

Koppensteiner E, Hamberger P, Bauer G, Kibbel H, Presting H, Kasper E et al. Investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. in Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II. Band 1985. 1993. S. 11-20. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.162744