Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser

K.K. Geerinck; E. Gornik; Wolfgang Johann Heiss; Manfred Helm; N.J. Hovenier; G.M.H. Knippels; C.J.G.M. Langerak; A.F.G. van der Meer; B.N. Murdin; C.R. Pidgeon; K. Unterrainer; W.T. Wenckebach

doi:10.1088/0268-1242/9/8/019

Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser

K.K. Geerinck
, E. Gornik
, Wolfgang Johann Heiss
, Manfred Helm
, N.J. Hovenier
, G.M.H. Knippels
, C.J.G.M. Langerak
, A.F.G. van der Meer
, B.N. Murdin
, C.R. Pidgeon
, K. Unterrainer
, W.T. Wenckebach

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Originalsprache	Englisch
Aufsatznummer	019
Seiten (von - bis)	1554-1557
Seitenumfang	4
Fachzeitschrift	Semiconductor Science and Technology
Volume	9
Ausgabenummer	8
DOIs	https://doi.org/10.1088/0268-1242/9/8/019
Publikationsstatus	Veröffentlicht - 1994

Wissenschaftszweige

103 Physik, Astronomie
103009 Festkörperphysik
103011 Halbleiterphysik
103017 Magnetismus
103018 Materialphysik
103040 Photonik
202032 Photovoltaik
210006 Nanotechnologie

Zugriff auf Dokument

10.1088/0268-1242/9/8/019

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Dieses zitieren

Geerinck, K. K., Gornik, E., Heiss, W. J., Helm, M., Hovenier, N. J., Knippels, G. M. H., Langerak, C. J. G. M., Meer, A. F. G. V. D., Murdin, B. N., Pidgeon, C. R., Unterrainer, K., & Wenckebach, W. T. (1994). Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser. Semiconductor Science and Technology, 9(8), 1554-1557. Artikel 019. https://doi.org/10.1088/0268-1242/9/8/019

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title = "Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser",

author = "K.K. Geerinck and E. Gornik and Heiss, \{Wolfgang Johann\} and Manfred Helm and N.J. Hovenier and G.M.H. Knippels and C.J.G.M. Langerak and Meer, \{A.F.G. van der\} and B.N. Murdin and C.R. Pidgeon and K. Unterrainer and W.T. Wenckebach",

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doi = "10.1088/0268-1242/9/8/019",

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Geerinck, KK, Gornik, E, Heiss, WJ, Helm, M, Hovenier, NJ, Knippels, GMH, Langerak, CJGM, Meer, AFGVD, Murdin, BN, Pidgeon, CR, Unterrainer, K & Wenckebach, WT 1994, 'Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser', Semiconductor Science and Technology, Jg. 9, Nr. 8, 019, S. 1554-1557. https://doi.org/10.1088/0268-1242/9/8/019

TY - JOUR

T1 - Excite-probe determination of the intersubband lifetime in wide GaAs/AlGaAs quantum wells using a far-infrared free-electron laser

AU - Geerinck, K.K.

AU - Gornik, E.

AU - Heiss, Wolfgang Johann

AU - Helm, Manfred

AU - Hovenier, N.J.

AU - Knippels, G.M.H.

AU - Langerak, C.J.G.M.

AU - Meer, A.F.G. van der

AU - Murdin, B.N.

AU - Pidgeon, C.R.

AU - Unterrainer, K.

AU - Wenckebach, W.T.

PY - 1994

Y1 - 1994

UR - https://www.scopus.com/pages/publications/0028486156

U2 - 10.1088/0268-1242/9/8/019

DO - 10.1088/0268-1242/9/8/019

M3 - Article

VL - 9

SP - 1554

EP - 1557

JO - Semiconductor Science and Technology

JF - Semiconductor Science and Technology

IS - 8

M1 - 019

ER -