Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Lisa Sonnleithner; Sandor Bacsi; Michael Oberlehner; Elene Kutsia; Alois Zoitl

doi:10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Lisa Sonnleithner
, Sandor Bacsi
, Michael Oberlehner
, Elene Kutsia
, Alois Zoitl

LIT Cyber-Physical Systems Lab

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Abstract

Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.

Originalsprache	Englisch
Titel	Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021
Erscheinungsort	New York, USA
Verlag	IEEE
Seiten	1-4
Seitenumfang	4
ISBN (elektronisch)	9781728129891
ISBN (Print)	978-1-7281-2989-1
DOIs	https://doi.org/10.1109/ETFA45728.2021.9613379
Publikationsstatus	Veröffentlicht - Dez. 2021

Publikationsreihe

Name	IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Band	2021-September
ISSN (Print)	1946-0740
ISSN (elektronisch)	1946-0759

UN SDGs

Dieser Output leistet einen Beitrag zu folgendem(n) Ziel(en) für nachhaltige Entwicklung

SDG 9 – Industrie, Innovation und Infrastruktur

Wissenschaftszweige

202017 Embedded Systems
102022 Softwareentwicklung
102025 Verteilte Systeme
102029 Praktische Informatik
202003 Automatisierungstechnik
202041 Technische Informatik

JKU-Schwerpunkte

Digital Transformation

Zugriff auf Dokument

10.1109/ETFA45728.2021.9613379

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)
Bauer, P. (Forscher*in), Fadhlillah, H. (Forscher*in), Gutierrez, A. (Forscher*in), Kutsia, E. (Forscher*in), Sharma, S. (Forscher*in), Sonnleithner, L. (Forscher*in), Unterdechler, M. (Forscher*in), Rabiser, R. (Projektleiter*in) & Zoitl, A. (Projektleiter*in)
01.02.2021 → 31.01.2028
Projekt: Geförderte Forschung › CDG - Christian Doppler Forschungsgesellschaft

Dieses zitieren

Sonnleithner, L., Bacsi, S., Oberlehner, M., Kutsia, E., & Zoitl, A. (2021). Do you smell it too? Towards Bad Smells in IEC 61499 Applications. in Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021 (S. 1-4). (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Band 2021-September). IEEE. https://doi.org/10.1109/ETFA45728.2021.9613379

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title = "Do you smell it too? Towards Bad Smells in IEC 61499 Applications",

abstract = "Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.",

keywords = "Anti-pattern, Bad smell, Code smell, CPPS, CPS, Design smell, Distributed control system, IEC 61499, OCL",

author = "Lisa Sonnleithner and Sandor Bacsi and Michael Oberlehner and Elene Kutsia and Alois Zoitl",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.",

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doi = "10.1109/ETFA45728.2021.9613379",

language = "English",

isbn = "978-1-7281-2989-1",

series = "IEEE International Conference on Emerging Technologies and Factory Automation, ETFA",

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Sonnleithner, L, Bacsi, S, Oberlehner, M, Kutsia, E & Zoitl, A 2021, Do you smell it too? Towards Bad Smells in IEC 61499 Applications. in Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, Bd. 2021-September, IEEE, New York, USA, S. 1-4. https://doi.org/10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications. / Sonnleithner, Lisa; Bacsi, Sandor; Oberlehner, Michael et al.
Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA: IEEE, 2021. S. 1-4 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Band 2021-September).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

TY - GEN

T1 - Do you smell it too? Towards Bad Smells in IEC 61499 Applications

AU - Sonnleithner, Lisa

AU - Bacsi, Sandor

AU - Oberlehner, Michael

AU - Kutsia, Elene

AU - Zoitl, Alois

PY - 2021/12

Y1 - 2021/12

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AB - Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.

KW - Anti-pattern

KW - Bad smell

KW - Code smell

KW - CPPS

KW - CPS

KW - Design smell

KW - Distributed control system

KW - IEC 61499

KW - OCL

UR - https://www.scopus.com/pages/publications/85122952884

U2 - 10.1109/ETFA45728.2021.9613379

DO - 10.1109/ETFA45728.2021.9613379

M3 - Conference proceedings

SN - 978-1-7281-2989-1

T3 - IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

SP - 1

EP - 4

BT - Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021

PB - IEEE

CY - New York, USA

ER -

Sonnleithner L, Bacsi S, Oberlehner M, Kutsia E, Zoitl A. Do you smell it too? Towards Bad Smells in IEC 61499 Applications. in Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA: IEEE. 2021. S. 1-4. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). doi: 10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Abstract

Publikationsreihe

UN SDGs

Wissenschaftszweige

JKU-Schwerpunkte

Zugriff auf Dokument

Andere Dateien und Links

Projekte

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)

Dieses zitieren