Characterization of ultrathin Cr layers on PET by RBS and XRF

Publikation: Beitrag in Fachzeitschrift › Konferenzartikel › Begutachtung

Originalsprache	Englisch
Seiten (von - bis)	763-766
Seitenumfang	4
Fachzeitschrift	Surface and Interface Analysis
Volume	34
Ausgabenummer	1
DOIs	https://doi.org/10.1002/sia.1406
Publikationsstatus	Veröffentlicht - Aug. 2002

Wissenschaftszweige

@article{b5bd9f6a2d8a4af186cc771777fe2969,

title = "Characterization of ultrathin Cr layers on PET by RBS and XRF",

author = "Markus Draxler and S. Zoister and Friedrich Kastner and Martin Bergsmann and Peter Bauer",

year = "2002",

month = aug,

doi = "10.1002/sia.1406",

language = "English",

volume = "34",

pages = "763--766",

journal = "Surface and Interface Analysis",

issn = "1096-9918",

publisher = "Wiley",

number = "1",

}

TY - JOUR

T1 - Characterization of ultrathin Cr layers on PET by RBS and XRF

AU - Draxler, Markus

AU - Zoister, S.

AU - Kastner, Friedrich

AU - Bergsmann, Martin

AU - Bauer, Peter

PY - 2002/8

Y1 - 2002/8

UR - https://www.scopus.com/pages/publications/0036693510

U2 - 10.1002/sia.1406

DO - 10.1002/sia.1406

M3 - Conference article

SN - 1096-9918

VL - 34

SP - 763

EP - 766

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 1

ER -