Abstract
The paper describes the characterisation of the radiated
electromagnetic emission (EME) caused by different
clock trees. Although the output-driver are assumed to be
one of the main sources for generation of
electromagnetic emission, the clock trees should also be
considered as a possible source for EME problems. This
paper therefore deals with clock tree measurements and
with the investigation how on-chip decoupling capacitors
could influence the EME of ICs. The TEM-cell method
described in IEC 61967-2 is used for these measurements.
| Originalsprache | Englisch |
|---|---|
| Titel | 4rd International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMCCOMPO 2004) |
| Seitenumfang | 6 |
| Publikationsstatus | Veröffentlicht - 2004 |
Wissenschaftszweige
- 102005 Computer Aided Design (CAD)
- 202 Elektrotechnik, Elektronik, Informationstechnik
- 202006 Computer Hardware
- 202018 Halbleiterelektronik
- 202023 Integrierte Schaltkreise
- 202027 Mechatronik
- 202028 Mikroelektronik
- 202037 Signalverarbeitung
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