Calibration of a Flexible High Precision Power-On Reset during Production Test

Gerald Hilber; Dominik Gruber; Michael Sams; Timm Ostermann

Calibration of a Flexible High Precision Power-On Reset during Production Test

Gerald Hilber
, Dominik Gruber
, Michael Sams
, Timm Ostermann

Institut für Integrierte Schaltungen und Quantum Computing

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Abstract

This paper describes a Power-On Reset (POR) circuit with very accurate threshold voltage levels. These voltage levels are achieved by calibrating an on-chip programmable voltage reference during the wafer sort or ﬁnal test. Two different calibration methods are proposed. One which calibrates the reference voltage of a comparator and another method which calibrates the POR threshold voltage levels itself. Not only the variation of the POR threshold voltage levels can be reduced from 90mV to 7mV, but also the absolute value can be changed.

Originalsprache	Englisch
Titel	International Test Conference 2012
Herausgeber*innen	International Test Conference
Seitenumfang	18
Publikationsstatus	Veröffentlicht - Nov. 2012

Wissenschaftszweige

102005 Computer Aided Design (CAD)
202006 Computer Hardware
202018 Halbleiterelektronik
202028 Mikroelektronik
202037 Signalverarbeitung

JKU-Schwerpunkte

Computation in Informatics and Mathematics
Mechatronics and Information Processing
Nano-, Bio- and Polymer-Systems: From Structure to Function

Dieses zitieren

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