An advanced impedance calibration method for nanoscale microwave imaging

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Originalsprache	Englisch
Titel	Microwave Symposium (IMS), 2016 IEEE MTT-S International
Verlag	IEEE
Seitenumfang	4
ISBN (elektronisch)	9781509006984
DOIs	https://doi.org/10.1109/MWSYM.2016.7540183
Publikationsstatus	Veröffentlicht - 09 Aug. 2016

Name	IEEE MTT-S International Microwave Symposium Digest
Band	2016-August
ISSN (Print)	0149-645X

Wissenschaftszweige

@inproceedings{68f433f1163c43ce8571c9771c260931,

title = "An advanced impedance calibration method for nanoscale microwave imaging",

author = "Manuel Kasper and Georg Gramse and Ferry Kienberger",

year = "2016",

month = aug,

day = "9",

doi = "10.1109/MWSYM.2016.7540183",

language = "English",

series = "IEEE MTT-S International Microwave Symposium Digest",

publisher = "IEEE",

booktitle = "Microwave Symposium (IMS), 2016 IEEE MTT-S International",

}

TY - GEN

T1 - An advanced impedance calibration method for nanoscale microwave imaging

AU - Kasper, Manuel

AU - Gramse, Georg

AU - Kienberger, Ferry

PY - 2016/8/9

Y1 - 2016/8/9

UR - https://www.scopus.com/pages/publications/84984940138

U2 - 10.1109/MWSYM.2016.7540183

DO - 10.1109/MWSYM.2016.7540183

M3 - Conference proceedings

T3 - IEEE MTT-S International Microwave Symposium Digest

BT - Microwave Symposium (IMS), 2016 IEEE MTT-S International

PB - IEEE

ER -