A DaQL to Monitor Data Quality in Machine Learning Applications

Lisa Ehrlinger; Verena Haunschmid; Davide Palazzini; Christian Lettner

doi:10.1007/978-3-030-27615-7_17

A DaQL to Monitor Data Quality in Machine Learning Applications

Lisa Ehrlinger
, Verena Haunschmid
, Davide Palazzini
, Christian Lettner

Institut für Anwendungsorientierte Wissensverarbeitung

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Originalsprache	Englisch
Titel	International Conference on Database and Expert Systems Applications (DEXA)
Herausgeber*innen	Sven Hartmann, Josef Küng, Gabriele Anderst-Kotsis, Ismail Khalil, Sharma Chakravarthy, A Min Tjoa
Erscheinungsort	Cham, Switzerland
Verlag	Springer International Publishing
Seiten	227-237
Seitenumfang	11
Band	11706
ISBN (Print)	978-3-030-27615-7
DOIs	https://doi.org/10.1007/978-3-030-27615-7_17
Publikationsstatus	Veröffentlicht - Aug. 2019

Publikationsreihe

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Band	11706 LNCS
ISSN (Print)	0302-9743
ISSN (elektronisch)	1611-3349

Wissenschaftszweige

102001 Artificial Intelligence
102010 Datenbanksysteme
102015 Informationssysteme
102033 Data Mining
102035 Data Science

JKU-Schwerpunkte

Digital Transformation

Zugriff auf Dokument

10.1007/978-3-030-27615-7_17

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Dieses zitieren

Ehrlinger, L., Haunschmid, V., Palazzini, D., & Lettner, C. (2019). A DaQL to Monitor Data Quality in Machine Learning Applications. in S. Hartmann, J. Küng, G. Anderst-Kotsis, I. Khalil, S. Chakravarthy, & A. M. Tjoa (Hrsg.), International Conference on Database and Expert Systems Applications (DEXA) (Band 11706, S. 227-237). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Band 11706 LNCS). Springer International Publishing. https://doi.org/10.1007/978-3-030-27615-7_17

Ehrlinger, Lisa ; Haunschmid, Verena ; Palazzini, Davide et al. / A DaQL to Monitor Data Quality in Machine Learning Applications. International Conference on Database and Expert Systems Applications (DEXA). Hrsg. / Sven Hartmann ; Josef Küng ; Gabriele Anderst-Kotsis ; Ismail Khalil ; Sharma Chakravarthy ; A Min Tjoa. Band 11706 Cham, Switzerland : Springer International Publishing, 2019. S. 227-237 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

@inproceedings{4600e5f3c82c4fa49efbc197fa5e5b4a,

title = "A DaQL to Monitor Data Quality in Machine Learning Applications",

author = "Lisa Ehrlinger and Verena Haunschmid and Davide Palazzini and Christian Lettner",

year = "2019",

month = aug,

doi = "10.1007/978-3-030-27615-7\_17",

language = "English",

isbn = "978-3-030-27615-7",

volume = "11706",

series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",

publisher = "Springer International Publishing",

pages = "227--237",

editor = "Sven Hartmann and Josef K{\"u}ng and Gabriele Anderst-Kotsis and Ismail Khalil and Sharma Chakravarthy and Tjoa, \{A Min\}",

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Ehrlinger, L, Haunschmid, V, Palazzini, D & Lettner, C 2019, A DaQL to Monitor Data Quality in Machine Learning Applications. in S Hartmann, J Küng, G Anderst-Kotsis, I Khalil, S Chakravarthy & AM Tjoa (Hrsg.), International Conference on Database and Expert Systems Applications (DEXA). Bd. 11706, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), Bd. 11706 LNCS, Springer International Publishing, Cham, Switzerland, S. 227-237. https://doi.org/10.1007/978-3-030-27615-7_17

A DaQL to Monitor Data Quality in Machine Learning Applications. / Ehrlinger, Lisa; Haunschmid, Verena; Palazzini, Davide et al.
International Conference on Database and Expert Systems Applications (DEXA). Hrsg. / Sven Hartmann; Josef Küng; Gabriele Anderst-Kotsis; Ismail Khalil; Sharma Chakravarthy; A Min Tjoa. Band 11706 Cham, Switzerland: Springer International Publishing, 2019. S. 227-237 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Band 11706 LNCS).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

TY - GEN

T1 - A DaQL to Monitor Data Quality in Machine Learning Applications

AU - Ehrlinger, Lisa

AU - Haunschmid, Verena

AU - Palazzini, Davide

AU - Lettner, Christian

PY - 2019/8

Y1 - 2019/8

UR - https://www.scopus.com/pages/publications/85077136155

U2 - 10.1007/978-3-030-27615-7_17

DO - 10.1007/978-3-030-27615-7_17

M3 - Conference proceedings

SN - 978-3-030-27615-7

VL - 11706

T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

SP - 227

EP - 237

BT - International Conference on Database and Expert Systems Applications (DEXA)

A2 - Hartmann, Sven

A2 - Küng, Josef

A2 - Anderst-Kotsis, Gabriele

A2 - Khalil, Ismail

A2 - Chakravarthy, Sharma

A2 - Tjoa, A Min

PB - Springer International Publishing

CY - Cham, Switzerland

ER -

Ehrlinger L, Haunschmid V, Palazzini D, Lettner C. A DaQL to Monitor Data Quality in Machine Learning Applications. in Hartmann S, Küng J, Anderst-Kotsis G, Khalil I, Chakravarthy S, Tjoa AM, Hrsg., International Conference on Database and Expert Systems Applications (DEXA). Band 11706. Cham, Switzerland: Springer International Publishing. 2019. S. 227-237. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). doi: 10.1007/978-3-030-27615-7_17